"Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique ..."

Seongmoon Wang, Xiao Liu, Srimat T. Chakradhar (2004)

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DOI: 10.1109/DATE.2004.1269074

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Seongmoon Wang, Xiao Liu, Srimat T. Chakradhar:
Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test Sets. DATE 2004: 1296-1301

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