"Design of Test Modules for the Analysis of MCM Interconnects."

Claudio Truzzi, Eric Beyne, Edwin Ringoot (1996)

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DOI: 10.1109/EDTC.1996.494378

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-20

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Claudio Truzzi, Eric Beyne, Edwin Ringoot:
Design of Test Modules for the Analysis of MCM Interconnects. ED&TC 1996: 614

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