"Consequences of RAM Bitline Twisting for Test Coverage."

Ivo Schanstra, Ad J. van de Goor (2003)

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DOI: 10.1109/DATE.2003.10052

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ivo Schanstra, Ad J. van de Goor:
Consequences of RAM Bitline Twisting for Test Coverage. DATE 2003: 11176-11177

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