"Test and Testability Techniques for Open Defects in RAM Address Decoders."

Manoj Sachdev (1996)

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DOI: 10.1109/EDTC.1996.494336

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-20

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Manoj Sachdev:
Test and Testability Techniques for Open Defects in RAM Address Decoders. ED&TC 1996: 428-434

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