"A Method of Test Generation fo Path Delay Faults Using Stuck-at Fault Test ..."

Satoshi Ohtake, Kouhei Ohtani, Hideo Fujiwara (2003)

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DOI: 10.1109/DATE.2003.10019

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Satoshi Ohtake, Kouhei Ohtani, Hideo Fujiwara:
A Method of Test Generation fo Path Delay Faults Using Stuck-at Fault Test Generation Algorithms. DATE 2003: 10310-10315

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