"DFT for Testing igh-Performance Pipelined Circuits with Slow-Speed Testers."

Muhammad Nummer, Manoj Sachdev (2003)

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DOI: 10.1109/DATE.2003.10047

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Muhammad Nummer, Manoj Sachdev:
DFT for Testing igh-Performance Pipelined Circuits with Slow-Speed Testers. DATE 2003: 10212-10217

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