"A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs."

Guilherme Cardoso Medeiros et al. (2020)

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DOI: 10.23919/DATE48585.2020.9116278

access: closed

type: Conference or Workshop Paper

metadata version: 2020-09-05

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Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui:
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. DATE 2020: 792-797

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