"Design fault directed test generation for microprocessor validation."

Deepak Mathaikutty et al. (2007)

> Home

Details and statistics

DOI: 10.1109/DATE.2007.364687

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/date/MathaikuttySKLD07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/date/MathaikuttySKLD07
Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V. Kodakara, David J. Lilja, Ajit Dingankar:
Design fault directed test generation for microprocessor validation. DATE 2007: 761-766

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.