"Fault Model Analysis of DRAM under Electromagnetic Fault Injection Attack."

Qiang Liu, Longtao Guo, Honghui Tang (2023)

> Home

Details and statistics

DOI: 10.23919/DATE56975.2023.10137146

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/date/LiuGT23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/date/LiuGT23
Qiang Liu, Longtao Guo, Honghui Tang:
Fault Model Analysis of DRAM under Electromagnetic Fault Injection Attack. DATE 2023: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.