"Learning-based dynamic reliability management for dark silicon processor ..."

Taeyoung Kim et al. (2016)

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type: Conference or Workshop Paper

metadata version: 2021-08-09

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Taeyoung Kim, Xin Huang, Hai-Bao Chen, Valeriy Sukharev, Sheldon X.-D. Tan:
Learning-based dynamic reliability management for dark silicon processor considering EM effects. DATE 2016: 463-468

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