"A gate level methodology for efficient statistical leakage estimation in ..."

Smriti Joshi et al. (2013)

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DOI: 10.7873/DATE.2013.221

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  - https://dblp.org/rec/conf/date/JoshiLBBG13
Smriti Joshi, Anne Lombardot, Marc Belleville, Edith Beigné, Stéphane Girard:
A gate level methodology for efficient statistical leakage estimation in complex 32nm circuits. DATE 2013: 1056-1057

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