"Utilization of SECDED for soft error and variation-induced defect ..."

Luong Dinh Hung et al. (2007)

> Home

Details and statistics

DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-28

- view
  - electronic edition @ acm.org
- export record
  dblp key:
  - conf/date/HungIGS07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/date/HungIGS07
Luong Dinh Hung, Hidetsugu Irie, Masahiro Goshima, Shuichi Sakai:
Utilization of SECDED for soft error and variation-induced defect tolerance in caches. DATE 2007: 1134-1139

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.