"Bit parallel test pattern generation for path delay faults."

Manfred Henftling, Hannes Wittman (1995)

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DOI: 10.1109/EDTC.1995.470351

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-20

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Manfred Henftling, Hannes Wittman:
Bit parallel test pattern generation for path delay faults. ED&TC 1995: 521-525

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