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"Power constrained and defect-probability driven SoC test scheduling with ..."

Zhiyuan He, Zebo Peng, Petru Eles (2006)

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DOI: 10.1109/DATE.2006.244141

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Zhiyuan He, Zebo Peng, Petru Eles:
Power constrained and defect-probability driven SoC test scheduling with test set partitioning. DATE 2006: 291-296

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