"Twin ECC: A Data Duplication Based ECC for Strong DRAM Error Resilience."

Hyeong Kon Bae et al. (2023)

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DOI: 10.23919/DATE56975.2023.10137096

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type: Conference or Workshop Paper

metadata version: 2023-06-07

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Hyeong Kon Bae, Myung Jae Chung, Young-Ho Gong, Sung Woo Chung:
Twin ECC: A Data Duplication Based ECC for Strong DRAM Error Resilience. DATE 2023: 1-6

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