"Optimizing Stresses for Testing DRAM Cell Defects Using Electrical Simulation."

Zaid Al-Ars et al. (2003)

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DOI: 10.1109/DATE.2003.10016

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Zaid Al-Ars, Ad J. van de Goor, Jens Braun, Detlev Richter:
Optimizing Stresses for Testing DRAM Cell Defects Using Electrical Simulation. DATE 2003: 10484-10489

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