"Product Surface Defect Detection Based on CNN Ensemble with Rejection."

Kai Su, Qiangfu Zhao, Po Chun Lien (2019)

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DOI: 10.1109/DASC/PICOM/CBDCOM/CYBERSCITECH.2019.00067

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Kai Su, Qiangfu Zhao, Po Chun Lien:
Product Surface Defect Detection Based on CNN Ensemble with Rejection. DASC/PiCom/DataCom/CyberSciTech 2019: 326-331

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