"Stuck-at Fault Resilience using Redundant Transistor Logic Gates."

Richard McWilliam et al. (2019)

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DOI: 10.1109/DASC/PICOM/CBDCOM/CYBERSCITECH.2019.00115

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-10

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Richard McWilliam, Philipp Schiefer, Alan Purvis, Samir Khan:
Stuck-at Fault Resilience using Redundant Transistor Logic Gates. DASC/PiCom/DataCom/CyberSciTech 2019: 595-601

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