"Measurement of Fast Rotation by VLSI Circuits."

Christof Born, Rainer A. Deutschmann (1997)

> Home

Details and statistics

DOI: 10.1007/978-3-642-60893-3_56

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/dagm/BornD97
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dagm/BornD97
Christof Born, Rainer A. Deutschmann:
Measurement of Fast Rotation by VLSI Circuits. DAGM-Symposium 1997: 517-524

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.