"Mustererkennung 1995, 17. DAGM-Symposium, Bielefeld, 13.-15. September ..."

Gerhard Sagerer, Stefan Posch, Franz Kummert (1995)

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DOI: 10.1007/978-3-642-79980-8

access: closed

type: Editorship

metadata version: 2019-06-24

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Gerhard Sagerer, Stefan Posch, Franz Kummert:
Mustererkennung 1995, 17. DAGM-Symposium, Bielefeld, 13.-15. September 1995, Proceedings. Informatik Aktuell, Springer 1995, ISBN 3-540-60293-3 [contents]

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