"Automatic System Level Test Generation and Fault Location for Large ..."

Akihiko Yamada et al. (1978)

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DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2012-03-01

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  dblp key:
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Akihiko Yamada, Nobuo Wakatsuki, T. Fukui, Shigehiro Funatsu:
Automatic System Level Test Generation and Fault Location for Large Digital Systems. DAC 1978: 347-352

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