"Transistor-level test generation for physical failures in CMOS circuits."

Hsi-Ching Shih, Jacob A. Abraham (1986)

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DOI: 10.1145/318013.318052

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Hsi-Ching Shih, Jacob A. Abraham:
Transistor-level test generation for physical failures in CMOS circuits. DAC 1986: 243-249

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