"On Estimating Impact of Loading Effect on Leakage Current in Sub-65nm ..."

Ashesh Rastogi, Wei Chen, Sandip Kundu (2007)

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DOI: 10.1145/1278480.1278658

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Ashesh Rastogi, Wei Chen, Sandip Kundu:
On Estimating Impact of Loading Effect on Leakage Current in Sub-65nm Scaled CMOS Circuits Based on Newton-Raphson Method. DAC 2007: 712-715

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