"Fault Characterizations and Design-for-Testability Technique for Detecting ..."

Kaamran Raahemifar, Majid Ahmadi (2001)

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DOI: 10.1145/378239.378496

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Kaamran Raahemifar, Majid Ahmadi:
Fault Characterizations and Design-for-Testability Technique for Detecting I_DDQ Faults in CMOS/BiCMOS Circuits. DAC 2001: 313-316

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