"Test generation for scan design circuits with tri-state modules and ..."

Takuji Ogihara et al. (1983)

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DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2012-03-01

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  dblp key:
  - conf/dac/OgiharaMTKF83
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  - https://dblp.org/rec/conf/dac/OgiharaMTKF83
Takuji Ogihara, Shinichi Murai, Yuzo Takamatsu, Kozo Kinoshita, Hideo Fujiwara:
Test generation for scan design circuits with tri-state modules and bidirectional terminals. DAC 1983: 71-78

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