"Testing functional faults in VLSI."

Yinghua Min, Stephen Y. H. Su (1982)

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DOI: 10.1145/800263.809234

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Yinghua Min, Stephen Y. H. Su:
Testing functional faults in VLSI. DAC 1982: 384-392

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