"Test Generation of Stuck-open Faults Using Stuck-at Test Sets in CMOS ..."

Hyung Ki Lee, Dong Sam Ha, Kwanghyun Kim (1989)

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DOI: 10.1145/74382.74440

access: closed

type: Conference or Workshop Paper

metadata version: 2019-04-11

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Hyung Ki Lee, Dong Sam Ha, Kwanghyun Kim:
Test Generation of Stuck-open Faults Using Stuck-at Test Sets in CMOS Combinational Circuits. DAC 1989: 345-350

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