"Noise characterization of static CMOS gates."

Rouwaida Kanj et al. (2004)

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DOI: 10.1145/996566.996803

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Rouwaida Kanj, Timothy Lehner, Bhavna Agrawal, Elyse Rosenbaum:
Noise characterization of static CMOS gates. DAC 2004: 888-893

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