"A Scheme for Overlaying Concurrent Testing of VLSI Circuits."

Wen-Ben Jone, Christos A. Papachristou, M. Pereira (1989)

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DOI: 10.1145/74382.74471

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Wen-Ben Jone, Christos A. Papachristou, M. Pereira:
A Scheme for Overlaying Concurrent Testing of VLSI Circuits. DAC 1989: 531-536

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