"Proptest: A Property Based Test Pattern Generator for Sequential Circuits ..."

Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz (1999)

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DOI: 10.1145/309847.310019

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

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Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz:
Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction. DAC 1999: 653-659

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