"A statistical simulation method for reliability analysis of SRAM core-cells."

Renan Alves Fonseca et al. (2010)

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DOI: 10.1145/1837274.1837487

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine:
A statistical simulation method for reliability analysis of SRAM core-cells. DAC 2010: 853-856

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