"Predicting fault detectability in combinational circuits - a new design tool?"

John L. Fike (1975)

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DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2012-03-01

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  dblp key:
  - conf/dac/Fike75
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  - https://dblp.org/rec/conf/dac/Fike75
John L. Fike:
Predicting fault detectability in combinational circuits - a new design tool? DAC 1975: 290-295

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