"Test Pattern Generation for Sequential MOS Circuits by Symbolic Fault ..."

Kyeongsoon Cho, Randal E. Bryant (1989)

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DOI: 10.1145/74382.74452

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-28

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Kyeongsoon Cho, Randal E. Bryant:
Test Pattern Generation for Sequential MOS Circuits by Symbolic Fault Simulation. DAC 1989: 418-423

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