"A test pattern ordering algorithm for diagnosis with truncated fail data."

Gang Chen et al. (2006)

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DOI: 10.1145/1146909.1147015

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Gang Chen, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski:
A test pattern ordering algorithm for diagnosis with truncated fail data. DAC 2006: 399-404

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