"Testing for Interconnect Crosstalk Defects Using On-Chip Embedded ..."

Li Chen, Xiaoliang Bai, Sujit Dey (2001)

> Home

Details and statistics

DOI: 10.1145/378239.378498

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/dac/ChenBD01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dac/ChenBD01
Li Chen, Xiaoliang Bai, Sujit Dey:
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores. DAC 2001: 317-320

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.