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"In-situ characterization and extraction of SRAM variability."

Srivatsan Chellappa et al. (2010)

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DOI: 10.1145/1837274.1837454

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

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  - conf/dac/ChellappaNYHVCCC10
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Srivatsan Chellappa, Jia Ni, Xiaoyin Yao, Nathan D. Hindman, Jyothi Velamala, Min Chen, Yu Cao, Lawrence T. Clark:
In-situ characterization and extraction of SRAM variability. DAC 2010: 711-716

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