"A new heuristic test generation algorithm for sequential circuits."

Toshihiro Arima et al. (1974)

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DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2012-03-01

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  - electronic edition @ acm.org
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  dblp key:
  - conf/dac/ArimaTAO74
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  persistent URL:
  - https://dblp.org/rec/conf/dac/ArimaTAO74
Toshihiro Arima, Mitsukuni Tsuboya, Goro Amamiya, Jiro Okuda:
A new heuristic test generation algorithm for sequential circuits. DAC 1974: 169-176

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