"Detection Defect in Printed Circuit Boards using Unsupervised Feature ..."

Ihar Volkau et al. (2019)

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DOI: 10.1109/CW.2019.00025

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Ihar Volkau, Abdul Mujeeb, Wenting Dai, Marius Erdt, Alexei Sourin:
Detection Defect in Printed Circuit Boards using Unsupervised Feature Extraction Upon Transfer Learning. CW 2019: 101-108

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