"Learning Second Order Local Anomaly for General Face Forgery Detection."

Jianwei Fei et al. (2022)

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DOI: 10.1109/CVPR52688.2022.01963

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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Jianwei Fei, Yunshu Dai, Peipeng Yu, Tianrun Shen, Zhihua Xia, Jian Weng:
Learning Second Order Local Anomaly for General Face Forgery Detection. CVPR 2022: 20238-20248

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