"Full orientation invariance and improved feature selectivity of 3D SIFT ..."

Stéphane Allaire et al. (2008)

> Home

Details and statistics

DOI: 10.1109/CVPRW.2008.4563023

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/cvpr/AllaireKBJP08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/cvpr/AllaireKBJP08
Stéphane Allaire, John J. Kim, Stephen L. Breen, David A. Jaffray, Vladimir Pekar:
Full orientation invariance and improved feature selectivity of 3D SIFT with application to medical image analysis. CVPR Workshops 2008: 1-8

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.