![](https://dblp.uni-trier.de./img/logo.320x120.png)
![search dblp search dblp](https://dblp.uni-trier.de./img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de./img/search.dark.16x16.png)
default search action
"An Integral Approach To Reuse Verification Code Towards Post Silicon Test ..."
Khim Hou Lee, Seow Pin Andy Chang (2008)
- Khim Hou Lee, Seow Pin Andy Chang:
An Integral Approach To Reuse Verification Code Towards Post Silicon Test Pattern Generation Design Validation And Analysis For Effective SoC Product Development. ESA 2008: 214-220
![](https://dblp.uni-trier.de./img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.