"A Surface Defect Detection Method based on Information Entropy."

Guoqing Zhang et al. (2023)

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DOI: 10.1109/CSCWD57460.2023.10152603

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-01

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Guoqing Zhang, Hongbo Sun, Xin Liu, Lei Liu:
A Surface Defect Detection Method based on Information Entropy. CSCWD 2023: 219-224

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