"A novel model for product defect detection based on the automatic aspect ..."

Zhongyun Li et al. (2024)

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DOI: 10.1109/CSCWD61410.2024.10580742

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-18

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Zhongyun Li, Yan Zhao, Yihong Wang, Zongyang Liu, Yushan Pan:
A novel model for product defect detection based on the automatic aspect term extraction. CSCWD 2024: 687-692

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