"A new morphology-based approach for similarity searching on wafer bin maps ..."

Tsung-Jung Hsieh et al. (2012)

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DOI: 10.1109/CSCWD.2012.6221923

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Tsung-Jung Hsieh, Chung-Shou Liao, Yu-Syuan Huang, Chen-Fu Chien:
A new morphology-based approach for similarity searching on wafer bin maps in semiconductor manufacturing. CSCWD 2012: 869-874

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