"HiL Test Based Fault Localization Method Using Memory Update Frequency."

Ki-Yong Choi et al. (2015)

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DOI: 10.1007/978-981-10-0281-6_108

access: closed

type: Conference or Workshop Paper

metadata version: 2019-03-08

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Ki-Yong Choi, Jooyoung Seo, Seung Yeun Jang, Jung-Won Lee:
HiL Test Based Fault Localization Method Using Memory Update Frequency. CSA/CUTE 2015: 765-772

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