default search action
"Machine Learning for the Recognition of Defects on the Surface of Film ..."
Ayumu Narita et al. (2024)
- Ayumu Narita, Teppei Shibata, Akira Fujii, Takanori Sato, Eduardo Carabez:
Machine Learning for the Recognition of Defects on the Surface of Film Capacitors. COMPSAC 2024: 1468-1471
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.