"VLSI Testing: A Decade of Experience."

Earl E. Swartzlander Jr., John A. Eldon, De D. Hsu (1985)

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type: Conference or Workshop Paper

metadata version: 2006-06-28

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Earl E. Swartzlander Jr., John A. Eldon, De D. Hsu:
VLSI Testing: A Decade of Experience. COMPCON 1985: 392-396

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