"High durability in NAND flash memory through effective page reuse mechanisms."

Kwangyoon Lee, Alex Orailoglu (2010)

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DOI: 10.1145/1878961.1878999

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Kwangyoon Lee, Alex Orailoglu:
High durability in NAND flash memory through effective page reuse mechanisms. CODES+ISSS 2010: 205-212

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