"Using the elman neural network as an identity map in defect detection task."

Volodymyr Khandetskyi, Nadiia Karpenko (2020)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2023-03-10

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Volodymyr Khandetskyi, Nadiia Karpenko:
Using the elman neural network as an identity map in defect detection task. CMIS 2020: 858-871

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