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"Dot profile model-based direct binary search."
Yafei Mao et al. (2023)
- Yafei Mao, Utpal Sarkar, Isabel Borrell, Lluis Abello, Jan P. Allebach:
Dot profile model-based direct binary search. Color Imaging: Displaying, Processing, Hardcopy, and Applications 2023: 208:1-208:6
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